Tender Description:
Nano pattering field emission filament based scanning electron microscope with EDS EBL and sputter coaterNano pattering field emission filament based scanning electron microscope with EDS EBL and sputter coater
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Published on
Sept. 19, 2024, 4:07 p.m.
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Oct. 10, 2024, 5 p.m.
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Sept. 19, 2024, 6 p.m.
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Oct. 10, 2024, 4:30 p.m.